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"You need to take out the verb "grow" on the title.Reliability is a problem already known long time ago. It doesn't "grow" but improve quite a bit"Did you really read all the articles, especially the ones on gate leakage in flash?If not, please note the primary problem is gate leakage due to thin oxide. As SNDK transitions to the next node, the oxide layer gets thinner making gate leakage WORST!
This is not a technical board so I won't reply any engineering details. But believe me I know those better than you.If you short this stock, be brave. If you are nervous, cover back before too late. But it is not necessary to post those tech stuffs on investors' board.