TOKYO--(Marketwire - Nov 27, 2012) - Leading semiconductor test equipment supplier Advantest Corporation (
The T2000 8GDM has the versatility to test a wide range of SoC interfaces while operating at data rates up to 8Gbps. Key capabilities include clock and data recovery (CDR), jitter injection, I/O dead band cancellation and multi-strobe operation. The module is available in an Enhanced Performance Package (EPP) capable of functional test abstraction (FTA), which can further shorten cycle times and streamline debugging.
"With its higher density and performance, our new T2000 8GDM positions us to capture even more market share in testing complex SoC devices with high-speed interfaces in multi-time domains," said Dr. Toshiyuki Okayasu, executive officer and executive vice president of the SoC Test Business Group at Advantest Corporation. "Both the FTA and EPP features enable system-level functional testing of these targeted semiconductors."
Advantest's module and tester designs are not only high performance, but also reduce test costs and time to market with high-throughput, multi-user environments and concurrent test capabilities -- all key performance attributes for overseas production facilities.
About Advantest Corporation
A world-class technology company, Advantest is the leading producer of automatic test equipment (ATE) for the semiconductor industry and a premier manufacturer of measuring instruments used in the design and production of electronic instruments and systems. Its leading-edge systems and products are integrated into the most advanced semiconductor production lines in the world. The company also focuses on R&D for emerging markets that benefit from advancements in nanotech and terahertz technologies, and has recently introduced multi-vision metrology scanning electron microscopes essential to photomask manufacturing, as well as a groundbreaking 3D imaging and analysis tool. Founded in Tokyo in 1954, Advantest established its first subsidiary in 1982, in the USA, and now has subsidiaries worldwide. More information is available at www.advantest.com.
All information supplied in this release is correct at the time of publication, but may be subject to change.
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