FormFactor Enables 2.4Gb/s At-Speed Test Breakthrough for Mobile DRAM Testing

Multiple DRAM Suppliers Take Delivery of Advanced High-Frequency Probe Cards for Known Good Die Testing

Marketwired

LIVERMORE, CA--(Marketwired - Mar 17, 2014) -  FormFactor, Inc. (NASDAQ: FORM) today announced the release of its latest High Frequency Test-at-Probe (HFTAP) probe-card technology, which enables mobile DRAM wafer test speeds of up to 2.4Gb/s. This new capability allows at-speed wafer testing of the highest speed specification for LPDDR3 memories, providing manufacturers with full Known Good Die (KGD) test capability. Probe cards with this new technology were recently delivered to four suppliers of LPDDR3 mobile DRAM.

LPDDR2 and LPDDR3 are the memory technologies of choice for mobile devices like tablets and smart phones. They enable speedier data transfer and better multi-tasking performance than "standard" DRAM technology -- with longer battery life through reduced power consumption. Deployment of the technology is increasing as DRAM manufacturers race to reduce mobile memory power consumption, even as memory arrays grow larger. Market research firm Gartner predicts that low-power mobile DRAM will account for over half of worldwide DRAM revenue by the end of 2014.*

FormFactor pioneered the capability of cost-effective at-speed-test probe cards when low-power SDRAM debuted more than a decade ago. Since then, the mobility-driven market trends of higher speeds with lower power consumption have imposed new performance demands on DRAM suppliers, resulting in ever-increasing test frequencies with reduced electrical test margins. FormFactor's HFTAP probe cards are the first in the industry capable of meeting the new LPDDR3 at-speed-test requirements.

"Making probe cards that cost-effectively test today's mobile DRAM chips is a natural extension of our HFTAP technology," said Mike Slessor, FormFactor's President. "Success in today's mobile-driven semiconductor market requires close collaboration with both our DRAM customers and the ATE suppliers. By working together to match our technologies, we've been able to extend performance capabilities to enable Known-Good-Die testing of today's high-end mobile DRAM parts."

* Gartner "Forecast: DRAM Market Statistics, Worldwide, 2010-2017, 4Q13 Update"

About FormFactor
FormFactor, Inc. (NASDAQ: FORM) is a leader in advanced wafer test solutions. The company's advanced wafer probe cards enable semiconductor manufacturers to lower their overall production costs, improve yields, and bring next-generation devices to market. FormFactor's acquisition of MicroProbe creates the leading wafer test solution provider for both memory and non-memory semiconductor manufacturers. FormFactor is headquartered in Livermore, California with operations in Europe, Asia and North America. For more information, visit the company's website at www.formfactor.com.

FormFactor, MicroProbe and the FormFactor and MicroProbe logos are registered or unregistered trademarks of FormFactor, Inc. All other product, trademark, company or service names mentioned herein are the property of their respective owners.

Forward-looking Statements:
Statements in this press release that are not strictly historical in nature are forward-looking statements within the meaning of the federal securities laws, including statements regarding anticipated results, market conditions or trends, expectations and operating plans. These forward-looking statements are based on current information and expectations that are inherently subject to change and involve a number of risks and uncertainties. Actual events or results might differ materially from those in any forward-looking statement due to various factors, including, but not limited to: the capability of the company's products to enable at-speed wafer testing of LPDDR3 memory devices at the highest speed specifications, and to improve chip manufacturers' Known Good Die (KGD) test outcomes; changes in the market demand for LPDDR2 and LPDDR3 devices; environments, the company's ability to work with customers and other Automated Test Equipment suppliers to extend the performance capabilities around wafer test and provide solutions that help customers optimize KGD outcomes. Additional information concerning factors that could cause actual events or results to differ materially from those in any forward-looking statement is contained in the company's Form 10-K for the fiscal year ended December 28, 2013, as filed with the SEC, and subsequent SEC filings, including the company's Quarterly Reports on Forms 10-Q. Copies of the company's SEC filings are available at http://investors.formfactor.com/edgar.cfm. The company assumes no obligation to update the information in this press release, to revise any forward-looking statements or to update the reasons actual results could differ materially from those anticipated in forward-looking statements.

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