Ultra-low Noise Probe System Provides Advanced Measurement Capability to Engineers Developing Next Generation ICs
LIVERMORE, Calif., Sept. 02, 2020 (GLOBE NEWSWIRE) -- FormFactor, Inc. (NASDAQ:FORM), a leading semiconductor test and measurement supplier, today introduced the CM300xi-ULN , a 300mm wafer probe system designed for highly accurate testing of flicker noise (1/f), random telegraph noise (RTN), and phase noise. These noise phenomena increasingly plague advanced analog and digital IC technologies, whose power and performance gains come at a cost of reduced noise tolerance. Thus, device design and validation now require careful characterization of these internal noise sources using highly sensitive equipment. By eliminating over 97% of the environmental noise experienced in previous probe systems, the CM300xi-ULN system establishes a new industry gold standard for the ultra-low noise measurement.
“The new CM300xi-ULN with Contact Intelligence fundamentally transforms the lab flicker noise measurement for leading-edge technology nodes below seven nanometers,” said Claus Dietrich, VP and GM of the Systems Business Unit at FormFactor. “It is now possible to deploy high-throughput, low-frequency flicker noise testing, for either semi-automated or fully autonomous probing with multi-DUT layouts for complete hands-free 24/7 operation. With the CM300xi-ULN taking the complexity out of low noise test cell optimization, test engineers need only to power on and begin testing.”
Industry Firsts in Low Noise Probing
FormFactor continues to pioneer new precision electrical measurement technologies, and the CM300xi-ULN showcases these advances. This revolutionary system achieves four significant industry “firsts” in the arena of on-wafer noise testing, including:
First automated probe station to achieve -190dB spectral noise* to make highly accurate noise measurements of new, high-performance devices (*typical, dBVrms/√Hz, 1kHz to 1MHz, with prober and thermal system enabled)
Integrated test cell power management which eliminates ground-loop induced noise and provides fully managed and filtered AC power for both probe system and instruments
Fully autonomous flicker noise thermal testing on 30um pads for up to 4x faster testing than previous generation systems
Customer site surveys and “low noise” installation verification to significantly reduce setup costs and tool deployment time
To request more information about the CM300xi-ULN, visit www.formfactor.com/contact-sales.
FormFactor, Inc. (NASDAQ:FORM), is a leading provider of essential test and measurement technologies along the full IC life cycle – from metrology and inspection, characterization, modeling, reliability, and design debug, to qualification and production test. Semiconductor companies rely upon FormFactor’s products and services to accelerate profitability by optimizing device performance and advancing yield knowledge. The Company serves customers through its network of facilities in Asia, Europe, and North America. For more information, visit the Company’s website at www.formfactor.com.
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